• Innovative new twist on a popular industry analysis method
   for advanced characterization.

• Provides engineers a tool for plotting two sets of test
  conditions against each other across multiple devices.
  Previous tools allowed only one device to be viewed at a time.  

• Takes advantage of new industry standard for data streaming.

Galaxy Semiconductor Inc. | 255 Constitution Dr. Menlo Park, CA 94025 USA | www.galaxysemi.com