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Galaxy Products / PAT-MAN™

PAT-MAN™

Cost-Effective Part Average Testing
and DPM Reduction

Analog Devices Selects Galaxy’s PAT- MAN...[more]
Allegro MicroSystems, Inc. Standardizes on Galaxy’s PAT-MAN...[more]

About PAT

Parts Average Testing ( PAT ) has recently been adopted by a number of semiconductor companies, primarily to help them meet the stringent requirements of the automotive industry (Automotive Electronics Council: AEC-Q001-Rev C). Indeed, reliability studies have shown that semiconductor parts that have abnormal characteristics tend to be higher contributors to long-term quality and reliability problems. That is, devices that originally passed all manufacturing tests but could be considered "outliers" compared to other parts in the same population or lot, are more likely to fail in the field. This is the basis for the process known as Parts Average Testing ( PAT ), which proactively identifies these outliers for exclusion from production shipments. This is done by modifying the pass/fail test limits based on statistical sampling of multiple devices.

Parts Average Testing ( PAT ) as detailed into the Automotive Electronics Council AEC-Q001-Rev C specifications only covers DPM techniques for normal (Gaussian) distributions. However, many distributions do not fall into the Gaussian category and require adapted PAT outlier detection methods to avoid excessive yield loss, or incorrect outlier detection.

Benefits using Outlier Identification & Removal

Using outlier identification/removal techniques allow to:

Significantly reduce quality and reliability issues and their consequences (e.g. customer returns, product recalls)
Quickly identify process shifts.
Provide a means to communicate rapid feedback amongst the members of the supply chain
Improve reliability of your products and your processes

PAT-MAN: A closed-loop solution

One of the major issues cost-conscious suppliers face is how to make the trade-off between lower defects per million (DPM) and yield. That was a key design consideration for the Galaxy PAT-MAN product: a closed-loop, optimized solution for managing the entire DPM reduction process.

Galaxy's PAT-MAN is a comprehensive solution for PAT and related DPM reduction techniques, which manages the DPM reduction process from initial wafer lot characterization to final-test yield monitoring. Based on a proven architecture and intuitive user interface, PAT-MAN integrates easily with your existing production test environment and provides the fastest and most cost-effective solution for DPM reduction in the industry.

Typical PAT-MAN Applications

Wafer sort : Post-processing step that covers parametric PAT, geographic PAT (good die in bad neighborhood), reticle PAT, and combinations of the above.
Final Test : Real-time process on the tester, which covers parametric PAT, trend monitoring, yield monitoring and alarm/reporting notifications.
Static PAT limits : Support for Automotive Electronics Council AEC-Q001 Rev C and JEDEC specifications
Dynamic PAT limit: Auto-adaptive algorithms for Gaussian distributions as well as non-Gaussian for minimized yield loss.

Learn more...

Learn more about Galaxy's solution for Parts Average Testing (outlier identification and removal) and other DPM-reduction techniques, please use our form to request your copy of the White Paper entitled:
PAT-MAN™: A Practical Approach to Parts Average Testing. [more]