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| Galaxy Products / Examinator™ |
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| What is Examinator? |
Examinator (the combination of EXAMINe + translATOR) is a software solution that enables test and product engineers to perform device characterization, production monitoring, and yield analysis studies from standard semiconductor data files such as STDF, Agilent GDF, e-Test (WAT and PCM), CSV, RosettaNet, etc.
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The
#1 solution for
semiconductor
test data analysis |
 Microsoft improves the Xbox® DPM with Galaxy
LTX
Signs OEM Agreement...[more]
Credence Standardizes on Galaxy...[more]
Wolfson Micro. improves IC Yield with Galaxy |
| Galaxy's Approach |
At Galaxy, our architects have nearly 20 years of experience in semiconductor test, and we optimized Examinator for today's test and product engineers who don't have time to master complex analysis tools. Our goal was to make Examinator a 'Single Click' solution so users would be only one or two mouse clicks away from the meaningful report they desire.
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| Who are our users? |
The majority of our
thousands of users are product, test and process engineers from fabless, IDM, subcontractor and ATE companies. Typically, these engineers conduct characterization and yield analysis studies in the early stages of a device launch, and then monitor production runs daily once the product matures. Given the millions of data points and the time pressure to resolve issues quickly, rapid data analysis is critical. And that's what Examinator delivers, as shown in the comparison below:
Note: Comparisons based on databases ≥ 60 MBs to ensure accuracy. (On smaller databases, the query response time of Galaxy Examinator was way too fast to compare!)
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| Data Analysis: Main Features |
You'll find all the reports you need:
Global information: tester, lot, operator information
Yield information: good parts, failing parts, parts retested
Test summary: Test name, limits, Fail count, Min, Max, Range, Mean, Sigma, Cp, Cpk, Skew, etc.
Test histogram: quickly view your test distribution
Parametric test wafer map: analyze the test gradient on your wafer to investigate process problems
Wafer map: see all dies tested in production, time info; stack and immediately compare multiple wafers (soft bin, hard bin, parametric,...)
 
Interactive 2D/3D charts: zoom into histograms, trend, scatter plots and wafer map charts
Parametric trend charts: see how test results evolve (repeatability analysis, or production trends)
Pareto reports: Cp of tests, Cpk of tests, test failures, software and hardware binning
Datalog: extract raw data from your database
Correlation reports and charts, Box plots, gage R/R: AV, EV, R&R, %R&R, PV, TV...
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| Test time reduction (TTR): Main Features |
Reducing testing time requires requires very deep data analysis and historical data analysis so to identify tests stability and tests correlation. With the help of Examinator, your test time reduction missions will be conducted much faster (to reorder, modify or eliminate tests). You'll have immediate access to comprehensive reports listing:
Test historical stability and failure information
Test to test correlation
Bin vs. Tests correlation plots
and more!
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| Data Reporting: Main Features |
Spending your valuable time building reports or presentation documents to review with team members or management is not the best use of your talents. With Examinator, it only takes one mouse click to create a complete report in any of the following standard file formats (no third-party software needed):
Word document (.doc)
PowerPoint slides (.ppt)
PDF file (.pdf)
HTML document (.htm)
Excel / CSV (.csv)
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| Productivity Features |
Examinator also includes the following features to help you easily manipulate your data and communicate your findings to others:
 An embedded browser GUI: the complete application is web enabled- no training is required!
Smart Import: allows you to easily extract production data with calendar date filters.
Import your STDF, WAT, Agilent GDF, etc. files directly: no database or converters are required
Store snapshots and notes of your most pertinent data in an HTML binder to share with others!
Automation: built-in scripting language for easy task automation.
Import/Export any report or data to/from other applications
Toolbox: All the tools to edit, dump or convert data files ( all formats supported, including STDF , ATDF , Agilent GDF, WAT , PCM ,
PIP7C7, etc)
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| Key Benefits |
User surveys indicate that customers find exceptional value in the following features:
Fast pre-configured report generation: creates all the popular reports simultaneously for a quick overview of the data.
Standard HTML report format: facilitates communication between supplier and customer, product engineer and test engineer, and PC and Unix user.
Unparalleled ease of use: enables immediate productivity without any training.
Versatility: supports a broad range of different tester platforms and data formats
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| Product Configurations and Pricing |
| Examinator - Characterization |
Examinator - Production |
| Configured primarily for device/ tester/load-board repeatability and correlation analysis. Suitable for analysis of a small number of data files. |
Configured for production yield enhancement, root cause analysis. Suitable for analysis of large data sets and multiple lots (trends, dispersions, test/ bin, etc.) |
| Licensing: Annual license- both floating and node-locked are available. Includes right of use, access to web support, phone support, new releases and upgrades. Discounts apply with volume orders. Pricing as low as $3/day/user! |
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| Minimum System Requirements |
| MS-Windows |
Unix & Linux |
| Windows
Vista, XP, 2003, 2000, NT, 95, 98 |
Sun Solaris 2.6 or higher;
Linux RedHat V3 or higher
(Intel processor) |
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Hardware: Your computer must also have at least one Ethernet board adaptor
(TCP/IP protocol)
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RAM:
1GB of RAM suggested to handle large data crunching
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Disk: 50MB of disk space for the software
installation.
Note: License manager requires 2MB of RAM when loaded in memory
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