See for yourself why Examinator is now the most widely used solution for IC Yield Enhancement and Semiconductor Data Analysis missions!
This release includes over 40 major enhancements covering:
Empowered Charts: more charts and options, full flexibility on colors, layers, multi-chart windows.
Characterization: new features and charts for even faster and easier characterization missions
Production: additional charts covering rolling yield trends, wafermap comparison, database administration tools, etc..
Data formats: additional input data formats supported with fast and reliable parsers.
Productivity: Ease of use and speed reach new heights. Examinator offers more flexibility than ever with even fewer mouse clicks!
Scripting language: additional keywords introduced for even more powerful automation, including interactive charting automation.
PAT ready: Looking to implement PAT ( Parts Average Testing ) to identify and eliminate outliers in production (wafer sort and final test)? Examinator-PAT is the solution of choice for you as it provides you will the only fully integrated turn-key solution for PAT and DPM (Defects Per Million) reduction. Contact Galaxy for more information on how to upgrade your Examinator into Examinator-PAT. |