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thousands of users worldwide!
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| Examinator Version 4.0 (Feb 2004) |
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Examinator is the fastest and most cost effective solution designed for easy semiconductor test data analysis and reporting. Examinator's unique highly intuitive interface makes any semiconductor data analysis, yield analysis and correlation mission a snap. As thousands of users have contributed to help sharpen this offer, it now brings the most productive data analysis solution at the best cost.
Examinator is designed from the ground-up using the latest standard technologies (Web interface, HTML and Excel/CSV reports, cross-platform support, network aware), it doesn't suffer from any legacy compromise. Examinator naturally and seamlessly integrates into your work flow, and gives you immediate returns. Significant productivity increase and cost savings are seen when standardizing on Examinator as no training is required: any new user masters the solutions in minutes! [more] |
| What's new in this release: |
 New Professional Edition: Enjoy 2D and 3D interactivity and dynamic drill/zoom functions. It is now a snap to perform any advanced root cause analysis into Histograms, trend charts, scatter plots, wafermaps, etc. Existing users can upgrade to the professional edition at any time.
More Production tools: automatic report generation and yield monitoring with alarms. Advanced wafer stacking report now automatically created. Additional options for even more flexibility!
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| Improvements cover: |
Outlier removal options work for tests with only one limit
Wafer stacking
Plot histograms, trends for Soft Bin, Hard Bin, Test time parameters.
Plot any parameter over binning or test time (scatter plot)
Parameter failure contribution: know which tests affect the binning
Production module: combine filters using the | character (eg: Lot1|Lot2)
Improved statistics sorting mode
and more!
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| Galaxy customers can download the release from: www.galaxysemi.com/customer |
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