Test Statistics: Examinator 'Options' menu now lets you select how test statistics are computed (can now be either from data samples, or summary record). Allows to overcome any corrupted summary in the data files processed, or focus on samples only (as in case of sampling, the summary doesn't match).
Binning: Examinator 'Options' menu now lets you select how binning summary counts are computed (can now be either from data samples, wafermap data, or summary record). Allows to overcome any corrupted summary in the data files processed.
Improved data files format support
Improved speed
Improved Agilent GDF support.

Galaxy customers can download the release from: www.galaxysemi.com/customer

Key Enhancements:

CSV / Excel data file support
Allow test number mapping (ideal for tester-to-tester brands correlation analysis)
Allow tests merge (ideal for merging multiple tests/parameters under a new test entry)
Updated on-line help

WAT (Wafer Acceptance Test) data file support
Test name string can be any length. No more truncation after 50 characters
Updated on-line help

Binning: new option field to allow to compute the binning summary from test data or from data files summary. Allows to correctly handle dies retested and maintain an accurate die count in the summary reports.
Failure count mode: stop on fail or continue on fail. Stop-on-fail makes Examinator count and report only one failure per test flow (the first failure found). Continue-on-fail makes Examinator count all failures found in each test flow (useful for test sequence optimization).