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Outlier removal can be specified in sigma of the distribution
Tests with Alarm are no longer ignored.
Improved support of files generated by VAX/Alpha systems.
Improved computerID detection
Improved HTML browser support for Windows 2000

Lets you have ALL the reports updated with the custom test limits.
See all test statistics updated accordingly, custom limits displayed with a different background for easy analysis.

Reports Device testing time when available.
Options lets you decide if datalog is organized in one or 2 rows
Display of low and high limits now correct
Datalog to CSV file no longer cause crashes .

Advanced reports:

Fixed missing test# in reports due to incorrect pinmap value handling.

Key Enhancements:

All reports support a test list filter: for any report type, you can now define the custom list of tests to include. E.g.: 1 to 10, 15, 17 to 19, 23)
Part & bin filters: now accept any custom list. E.g.: 1 to 500, 600 to 900
Test names picker: Lets you select all the tests you want from a list.
Data can be sorted by date or selection order.
Flying neptus: contexts help for sharp on-line help. Excellent for new users!
"How to" pages include additional links to typical Engineering and Production case studies.
Improved outliers filter & fail count now correctly updated.
Improved license activation process for Windows 95-98 computers.
Improved multi-sites processing.
Improved correlation alarm: not longer flags sigma reduction, but sigma increase only.

Now fully configurable. Also supports a Test list filter: only list the tests you want (ex: fails test, etc.)

Histogram advanced report:

Fitting curve can now be plotted ('Options' page now allows to plot histogram bars, fitting curve or both)
 Increased resolution to 30 bars for sharper analysis.

Trend advanced report:

New: chart difference between tests. Chart TestX - Test Y
New: Production trend of Software or Hardware Binning list over Sub-lots.
New: Production trend of Software or Hardware Binning list for all parts tested.
Can now also plot trend points without connecting them: convenient for comparing correlation of test over different files/testers.
A Lot# marker is visible on the chart. 
PartID and X scale better handle very small data sets (e.g.: less than 15 parts)

Wafer map report:

Parametric test over test limits chart accepts test with one or no limits (Min/Max values used instead).

Datalog report:

HTML datalog pages now include page breaks to avoid huge pages to be created. 
Loading time now significantly reduced