| Galaxy STDF EXAMINATOR Version 2.4 |
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| Release date: December 14, 2001 |
The speed and ease of use highly contributed to the success of the previous release. This release remains amazingly fast! While other data analysis solutions painfully take minutes to process any of your query, Galaxy Examinator does it in just few seconds...if not less! This solution screams: there is no word strong enough, you have to try it!
If you have any suggestions to improve the Galaxy Examinator solution, please forward your comments/requests to our support team at support.examinator@galaxysemi.com or complete the Product Feature Request form.
Find out what's new in this release: |
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| ENHANCEMENTS |
 Multi-platforms : Runs under Windows (95, 98, Me, NT, 2000, XP), Sun Solaris 2.6 or higher and HP-UX 10.20 or higher (we've completely reviewed the HP-UX release so no library, and compatibility issue remain).
More filters: on top of all existing filters, you can now also define a part or bin exclusion set (e.g.: process all parts except Bin 7 to Bin 9)
Wafer map: improved display to support any wafer size, and lets you display hardware and software binning. X and Y scales are now included so you can identify each die coordinate.
Parametric trend charting: We've added this great new report. It allows to display trend plot for any test results, no matter how many samples you have!
and much more... |
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| Note: Examinator V2.4 is the very last release we publish that is limited to processing a single STDF file. In 2002, you'll be delighted by our new Examinator release V3.0...it will include major enhancements and dramatic changes...but will stick to our mission: a blazing speed, with canned reports! |
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