We want this tool to provide the exceptional features and usability you have come to expect from Galaxy Semiconductor software.

If you have any suggestions to improve the STDF Examinator tool, please forward your comments/requests to our support team at support.examinator@galaxysemi.com or complete the Product Feature Request form.

STDF global information: if date info is missing, display 'n/a' instead of 1-Jan-1970.
Wafermap: Negative dieX or dieY data were not correctly handled.
Test name: was sometimes missing in report (when it was not found in PTR but only in TSR).
Settings: Chart limit field, now saves user selection.
Improved drawing when charting space includes Limits.

About box: now includes 'Walk of Fame' (list of contributors).
Help manual: includes a new section listing which STDF records are used, and how.
Wafermap: the 'binning' label in the table is a hyperlink to the binning summary page, allowing full details on binning information.
Wafermap: Provides a table of color/bin value, and also the percentages of each bin, and which are pass/fail.
Binning Summary: now includes pass/fail information for each bin.