Examinator in a nutshell
Examinator is used by over 2,500 engineers worldwide because
it offers the ideal compromise between ease of use and power:
your can perform any statistical analysis on your semiconductor
data, from analyzing a Mean, Median, Sigma, range, Cp, Cpk or
yield. Using the Built in editor or playing with the many
filtering options, you can change the data and immediately see
the effect on Mean, Median, Sigma, range, Cp, Cpk and yield. The
built-in What-If Guard banding report lets you easily find the
optimal parameter test limits for a given production Yield and
Cp, Cpk per test.
Start your semiconductor data analysis journey by either
manually selecting your test data files from Examinator (
Semiconductor ATE Test Data and Yield Analysis Software ) for
semiconductor characterization Statistical data analysis, or
running a query over the database for production Statistical data
analysis. Examinator accepts natively semiconductor test data analysis file formats such as STDF
( STDF V3 and STDF V4) , ATDF ,WAT, Agilent GDF, PCM and
comma separated value file ( CSV ). Upload STDF,
ATDF, CSV files just in one click into the Examinator database.
Regular Examinator users will much appreciate
Examinator-Production built-in database as uploading STDF and ATDF files
is done only once! And heavy Examinator users will even better
enjoy the Yield-MAN module as all STDF , ATDF and
production test data files are automatically inserted into the
database!
Examinator includes a built-in Excel like editor so you can edit
and save any semiconductor data file ( STDF , ATDF , WAT,
Agilent GDF, PCM ,
etc ) . This powerful editor lets your edit any information
including parameter values, parameter test limits, binning
results, die location, testing site or testing head and
more! Examinator lets you filter your semiconductor data in many
ways: in only one mouse click, you can select to restrict
analysis on
good devices, or enter the device IDs to focus on (very
convenient when working on golden devices) or even select an
outlier removal rule.
In HTML format or under interactive tables, Examinator
( Semiconductor ATE Test Data and Yield Analysis Software )
lets you
review all critical statistical information for each test
parameter analyzed : Parameter name, specification limits, test
execution count, failure rate ( parameter Yield level ), Mean,
Range, Sigma, Cp, Cpk for standard semiconductor
characterization analysis or production lot distribution. Also,
Examinator
( Semiconductor ATE Test Data and Yield Analysis Software )
offers a large range of advanced statistical information such as
Quartiles / Percentiles, Median, distribution Skew or Kurtosis values.
Examinator
( Semiconductor ATE Test Data and Yield Analysis Software ) lets
you easily compare any test statistics values like Mean, Median, Sigma, range, Cp, Cpk and yield of
different parameters or tests and computes shifts automatically
for you. If a drift between datasets is higher than a user
configurable limit, Mean, Sigma or Cpk drifts are highlighted in
red and flagged in a summary page. Each alarm level for the
Mean, Sigma and Cpk can be defined or disabled independently. This functionality lets you easily
analyze and compare
distributions and conduct any correlation analysis in a matter
of minutes. This is an ideal canned report for any tester
correlation analysis or process correlation analysis ( tester
vendor qualification, subcontractor qualification, etc)
Creating histograms with Examinator is a snap (
Semiconductor ATE Test Data and Yield Analysis Software ). As
soon as you have defined your test data filter, all histograms are
created automatically as HTML Web pages you can browse! You
can also enter into the interactive mode at any time and browse
into interactive histograms you can customize on the flight: overlay an unlimited number of
parameter histograms, modify charting styles, etc. This is a powerful tool for
semiconductor characterization missions when starting a new
production and comparing testers to testers or load board to load board. It is also
a powerful tool when performing
semiconductor correlation analysis over different IC products release or test
program revisions. No matter what semiconductor characterization
or correlation analysis you want to do, Examinator
( Semiconductor ATE Test Data and Yield Analysis Software )
will be a
great companion. Histogram charts also let you enable
or hide test statistics markers such as test limits, Mean, 1, 3
or 6 Sigma space and also display test statistics tables
including: Mean, Median,
Sigma, Range, Failing count, Cp, Cpk, Yield and advanced test
statistics such as Quartiles / Percentiles, Skew, Kurtosis values.
When it comes to create semiconductor wafer map charts, Examinator
( Semiconductor ATE Test Data and Yield Analysis Software ) is
again the solution of choice. In a matter of seconds, Examinator
turns any of your STDF, ATDF, Agilent GDF, PCM, WAT or CSV semiconductor data
into 2D and 3D wafermaps including: software binning wafermap,
hardware binning wafer map, parametric wafer map ( see how a
parameter value evolves on each die ). Using the HTML wafer map
report, you can instantly share such valuable chart with others
on your intranet or by email. And leveraging Examinator's powerful
interactive interface, you can rotate and drill into your
wafer map at any zooming level. The Examinator contextual
selection lets you click any die and know all about it: its die
location, tester site and head used, tests executed and
failures, and more!
Complete Control over your Test Data
Examinator ( Semiconductor ATE Test Data and Yield Analysis
Software ) offers a very easy and flexible interface to select
your test data files ( like STDF, ATDF, Agilent GDF, PCM, WAT or CSV ) and
filter the information to process for your semiconductor
characterization or production analysis. When leveraging the
Examinator
( Semiconductor ATE Test Data and Yield Analysis Software )
built-in database, you can review the data file
headers at insertion time and edit the fields used a keys for
future test data queries.
Examinator ( Semiconductor ATE Test Data and Yield Analysis
Software ) allows you to customize the content of the report
created so only the information you want to focus on remains.
E.g: during semiconductor characterization missions, end-users
may prefer to focus on test parameters with Cpk lower than 1.33.
It only takes few mouse clicks to try different reports outputs
and keep what best serves your purpose!
From
Examinator ( Semiconductor ATE Test Data and Yield Analysis
Software ), it only takes one click to print any HTML Web report page, or capture any chart into your clipboard for
instant export into other applications ( Microsoft Office: Word,
Excel, PowerPoint, etc ). Any HTML Web report page
(including test statistics with Mean, Median, Sigma, range, Cp, Cpk, yield
and advanced statistics as well as histograms, trends charts,
scatter plots and wafer maps) can be printed individually or all
at once simply clicking the Examinator's printer icon.
Examinator ( Semiconductor ATE Test Data and Yield Analysis
Software ) offers a scripting language for repetitive tasks
automation. Scripts are cross-platform compatible and can run
without any modification under the Windows, Unix and Linux platforms.
Any report you create under Examinator can also be built using
the scripting language.
: Monitoring
Examinator ( Semiconductor ATE Test Data and Yield Analysis
Software ) when used in a real-time production environment can
greatly benefit of the Monitoring module. This module
allows to automate all reports creation (including the statistical analysis
with Mean, Median,
Sigma, range, Cp, Cpk and yield ) as well as notify on any
abnormal yield level or parameter out of specs. Parameter specs
monitored in real-time include: semiconductor test result, Mean, Sigma, range, Cp, Cpk
and yield levels.
The Semiconductor industry heavily relies on Unix systems
especially for all production tasks. Also, all high end
professional engineering applications are usually running under
Unix Solaris platforms. As such, limiting a data analysis tool
to a Unix or Widows only technology (E.g: Unix database,
Microsoft database, etc) is a technical bottle neck for any
serious corporate deployment of the solution. Examinator exists
in Windows and Unix native applications and relies on
cross-platform technologies only so deployment can always
smoothly integrate into the complex end-users network
environment. For over 15 years, Galaxy's engineers have been
dealing daily with semiconductor leading companies and have
built a strong know-how that now benefits the Examinator product
line. Examinator has been designed to run on any existing
platform and easily interface to any third-party tools if needed
(customer PC or Unix database, data mining tools, corporate
tools, etc).
The STDF and ATDF semiconductor data files rely on specific
format created by Teradyne back in the 80's. The intent was to
create a fixed format, well documented so anyone would be able
to build compliant STDF and ATDF files. It was a fair goal to
make all testers and data analysis tools share one common
language: STDF and ATDF. However the reality today is very
different. There are as many STDF and ATDF implementations as
tester vendors and tester brands they sale (not to mention the
software revisions they ship). The STDF and ATDF weak point
leads in its structure that allows almost unlimited
flexibility in the way records appear and relate to each other.
The obvious outcome is that each flavor of STDF and ATDF
semiconductor data file must be carefully validated. This is one
of Galaxy's core expertise that nothing but experience can
replace. Thousands of STDF and ATDF semiconductor test data
files from all tester vendors have been tested and validated
under Examinator ( Semiconductor ATE Test Data and Yield
Analysis Software ) .
|
Customers Only
