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Analog Devices Galaxy

Freescale Semiconductor Selects Galaxy’s PAT-Man™ Characterization for Zero Defect Quality Initiative
 
 
Press Release  

- Galaxy software to be deployed at Freescale sites worldwide for outlier detection process

WALTHAM, Mass, March 11, 2008  -- Freescale Semiconductor has selected Galaxy’s PAT-Man™ Characterization software for use as part of Freescale’s Zero Defect Quality Initiative at Freescale sites worldwide. 

Freescale is the world’s leading semiconductor provider for the automotive industry. The company’s microcontrollers, sensors, analog and mixed-signal products are used throughout mission-critical vehicle safety and power train systems, such as airbags, electronic stability control and engine management. Freescale’s Zero Defect Initiative institutes detailed quality processes across every phase of production for these devices, including design, wafer fabrication, assembly and test. The PAT-Man™ Characterization product is now part of Freescale’s test process, and is expected to be used primarily for recipe creation and data analysis for  dynamic PAT and other outlier detection methods at wafer sort.

Galaxy PAT-Man™™ is a software solution for Part Average Testing (PAT) and related dpm reduction techniques, which helps eliminate parametric and proximity-based outliers and thereby improves device reliability. PAT applies statistically calculated limits to identify and remove abnormal parts during the testing process. Results outside the limits are considered outliers and are not shipped, even though they are technically within specification. PAT-Man™ Characterization provides an easy to use, interactive environment that engineers can use to define PAT rules and limits based on historical data, and then predict the impact on yield.

“Reliability and cost are of paramount concern for our automotive customers, and ultimately to millions of drivers around the world”, said David Woodbury, Chief Manufacturing Systems Architect at Freescale. “Galaxy’s PAT-Man™ will help us optimize both by providing us the insight needed to implement outlier detection on select devices.   In evaluating Galaxy we were especially impressed by the product’s ease of use and extensibility, as well as the company’s outstanding support.”

”With Freescale’s decades of leadership in the semiconductor quality arena we are especially honored to have been selected for the company’s Zero Defect Initiative,” said Bertrand Renaud, COO at Galaxy. “Freescale will be an invaluable “lighthouse” partner as it deploys PAT across its product lines and helps us optimize our solutions for the needs of high-volume semiconductor manufacturing.”

About Galaxy

Galaxy Semiconductor is a leading provider of test data analysis, yield management and DPM reduction software for the semiconductor industry. Galaxy products are used by thousands of users worldwide to help increase device yields, reduce defects and improve engineering productivity. Galaxy products are easy to learn and use, and offer a very short time-to-benefit, coupled with a compelling return on investment.  More information about Galaxy can be found at www.galaxysemi.com.


CONTACT: Galaxy

Bertrand Renaud, 781-891-1148
BertrandRenaud [~at~] galaxysemi.com

SOURCE: Galaxy Semiconductor


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