| News / Galaxy Presentation AEC 2006 |
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May 2nd, 2006
Tuesday - AEC Session 2 - Discrete Semiconductors Issues
Session 2A.3
1:15 pm - 3:00 pm |
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Minimizing Yield Loss with Parts Average Testing (PAT)
and other DPM Reduction Techniques |
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| Parts Average Testing (PAT) is growing in popularity as a means to improve the reliability of semiconductors used in automotive applications. The goal of PAT is to remove “outliers” (parts that exhibit characteristics that are atypical when compared to parts from the same wafer or lot). However, there is a danger that if PAT limits are set too tightly, the net result will be unacceptable yield-loss, and hence, significantly higher device cost. This paper, citing customer case studies, will describe a closed-loop approach to PAT and other DPM-reduction techniques, which improves device quality while minimizing unnecessary yield loss [more]. |
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About Galaxy
Galaxy Semiconductor Solutions is a leading provider of test data analysis and quality improvement solutions for the semiconductor industry. Galaxy products are used by over 1000 users worldwide to help increase device yields, reduce defects and improve engineering productivity. Galaxy products are easy to learn and use, and offer a very short time-to-benefit, coupled with a compelling return on investment. More information about Galaxy can be found at www.galaxysemi.com |
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CONTACT: Galaxy Semiconductor
Bertrand Renaud, 781-891-1148
Bertrand.renaud@galaxysemi.com |
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