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  Examinator V5.6: Get the latest Galaxy technologies for your yield and failure analysis

  Eagle selects Galaxy for Test Data Analysis

 

  IC Yield Enhancement: Examinator V5.5 released

 Success story: RF IC Characterization at Quorum Systems

 Analog Devices Selects Galaxy’s PAT- MAN for Defect Per Million (DPM)
   Reduction Program in Automotive Market

 Oct 11: FSA Suppliers Expo and conference. Visit us at San Jose McEnery Convention Center, booth#509
 Oct 24: Automotive Electronics Congress. Visit Galaxy at Hotel Sofitel Sèvres, Salon St. Exupery 7 (from 10h00 to 17h00). For more info, please visit: http://www.automotive-electronics-congress.com/

 Sept 13: FSA Yield Management Software conference.

 May 2: Automotive Electronic Council Integrating Parts Average Testing (PAT) in the Production Test Process.

 Examinator V5.2: Get the latest Galaxy technologies for your yield and failure analysis

 Credence standardizes on Galaxy

 ISE Labs standardizes on Galaxy

 Examinator V5.1 released
The Reference for Yield Enhancement and Semiconductor Data analysis

 New product:
PAT-MAN™ for Part Average Testing and DPM reduction

 LTX Signs OEM Agreement with Galaxy

 Examinator for Linux

 Examinator V5.0 released
The Reference for Yield Enhancement and Semiconductor Data analysis

 Examinator V4.2 released
The Reference in Semiconductor Data analysis

 Examinator V4.1 released
One-Click Gage R&R' and more Data analysis!

 Examinator V4.0
Ideal for Semiconductor Data analysis and Yield Optimization

 Optimizing Test Time (EE-Evaluation Engineering October 2003)

 Examinator V3.4 B12 released

 Customer support: Have access to the latest Galaxy releases

 Audit V2.1 B12 released: Program efficiency diagnostic

 Introducing Examinator-Production for Yield optimization

 Top 3 business reasons why people prefer Examinator

 MV Technical Sales, LLC endorses Examinator

 Examinator V3.4 released

 Examinator V3.3 released